首页> 外国专利> Manufacturing method of MEMS probe tip by ultra high frequency laser and MEMS probe tip designed by same method

Manufacturing method of MEMS probe tip by ultra high frequency laser and MEMS probe tip designed by same method

机译:利用超高频激光制造MEMS探针的方法及采用该方法设计的MEMS探针

摘要

The disclosed content relates to a method of manufacturing a probe capable of processing a shape of a probe tip having a fine size in three dimensions, processing a plurality of probe tips at the same time, and reprocessing even when the probe tip is worn. More specifically, in a method of manufacturing a MEMS probe tip, a first step of measuring coordinates of the probe pins on an upper surface of a probe head in which a plurality of probe pins are disposed through a guide hole, and a first step of measuring the height of the probe pins Step 2 presents a method of manufacturing a MEMS probe tip using a microwave laser including a third step of processing a shape of a probe tip located at one side of the probe pin by a laser.
机译:所公开的内容涉及一种制造探针的方法,该探针能够处理具有三个尺寸的微小尺寸的探针头的形状,同时处理多个探针头并且即使在探针头磨损时也进行再加工。更具体地,在制造MEMS探针头的方法中,第一步是测量探针头的上表面上的探针的坐标的步骤,所述第一步通过引导孔布置有多个探针,测量探针的高度步骤2提出了一种使用微波激光器制造MEMS探针的方法,该方法包括第三步,通过激光处理位于探针一侧的探针的形状。

著录项

  • 公开/公告号KR102154176B1

    专利类型

  • 公开/公告日2020-09-09

    原文格式PDF

  • 申请/专利权人 주식회사 에스디에이;

    申请/专利号KR20180135389

  • 发明设计人 강신교;임창민;심상범;

    申请日2018-11-06

  • 分类号G01R1/067;B23K26/21;B23K26/60;G01R1/073;G01R3;

  • 国家 KR

  • 入库时间 2022-08-21 11:03:47

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