首页> 外国专利> TEMPERATURE MEASUREMENT SYSTEM AVERAGE TEMPERATURE ANALYSIS METHOD LOWEST TEMPERATURE ANALYSIS METHOD HEATING TIME SETTING METHOD OF COOKED FOODS

TEMPERATURE MEASUREMENT SYSTEM AVERAGE TEMPERATURE ANALYSIS METHOD LOWEST TEMPERATURE ANALYSIS METHOD HEATING TIME SETTING METHOD OF COOKED FOODS

机译:温度测量系统平均温度分析法最低温度分析法熟食加热时间设定法

摘要

The present invention provides a temperature measurement system, an average temperature analysis method, a lowest temperature analysis method, and a heating time setting method for cooked foods which increase reliability of set heating time. The temperature measurement system comprises: a base unit on which a measurement target heated for a prescribed heating time is placed; a temperature measurement module having a plurality of measurement members placed at a plurality of measurement points of the measurement target, respectively, and measuring temperature so as to simultaneously measure the temperatures of the plurality of measurement points; and a control unit to receive temperature values measured by the temperature measurement module to record the temperature values at prescribed unit time intervals, and analyze the average temperature of the measurement target based on the temperatures recorded at the prescribed unit time intervals. In addition, according to the present invention, the average temperature analysis method comprises: a temperature measurement step of simultaneously measuring the temperatures of a plurality of measurement points of the measurement target heated for a prescribed heating time at prescribed unit time intervals within a prescribed measurement time range by using a plurality of measurement members; and an average temperature calculation step of recording temperature values measured in the temperature measurement step at the prescribed unit time intervals, and analyzing the average temperature of the measurement target based on temperatures recorded at the prescribed unit time intervals.
机译:本发明提供了提高了设定加热时间的可靠性的熟食的温度测量系统,平均温度分析方法,最低温度分析方法以及加热时间设定方法。该温度测量系统包括:基本单元,其上放置有被加热预定加热时间的测量目标;以及温度测量模块,其具有分别放置在所述测量目标的多个测量点处的多个测量构件,并测量温度以同时测量所述多个测量点的温度;控制单元,其接收由温度测量模块测量的温度值,以规定的单位时间间隔记录温度值,并基于以规定的单位时间间隔记录的温度来分析测量对象的平均温度。另外,根据本发明,平均温度分析方法包括:温度测量步骤,该温度测量步骤以规定的测量时间以规定的单位时间间隔同时测量在规定的加热时间内被加热了的测量对象的多个测量点的温度。通过使用多个测量构件的时间范围;平均温度计算步骤,以规定的单位时间间隔记录在温度测定步骤中测定的温度值,并基于以规定的单位时间间隔记录的温度来分析测定对象物的平均温度。

著录项

  • 公开/公告号KR20200023979A

    专利类型

  • 公开/公告日2020-03-06

    原文格式PDF

  • 申请/专利权人 CJ CHEILJEDANG CORPORATION;

    申请/专利号KR20180100559

  • 申请日2018-08-27

  • 分类号G01K3/02;F24C7/08;G01K1/02;G01N25/20;

  • 国家 KR

  • 入库时间 2022-08-21 11:07:42

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