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Analyzing Method of Diamond Single Crystal Using Ultraviolet Photoluminescence

机译:紫外光致发光法分析金刚石单晶

摘要

The present invention relates to a method for analyzing defects in diamond crystals using ultraviolet photoluminescence, according to the present invention, an ultraviolet irradiation step in which ultraviolet light emitted from a light source is irradiated to the surface side of a diamond single crystal; A photoluminescence image information acquisition step of acquiring photoluminescence image information by receiving a photoluminescence emitted from the surface side of the diamond single crystal irradiated with the ultraviolet light in the ultraviolet irradiation step and obtaining photoluminescence image information; And the photoluminescence image information acquired by the camera device in the photoluminescence image acquisition step is transferred from the camera device side to the data processing device side, and the diamond single crystal defects can be determined, so that the data processing is performed. A data processing step in which the device converts the photoluminescence image information into at least one color point that can be displayed on a predetermined color space; Since it contains, it is possible to analyze the defect distribution of diamond single crystal with high reliability.
机译:本发明涉及一种利用紫外光致发光分析金刚石晶体中的缺陷的方法,根据本发明,一种紫外辐照步骤,其中将从光源发射的紫外光辐照到金刚石单晶的表面侧。光致发光图像信息获取步骤,其通过接收在紫外线照射步骤中从被紫外线照射的金刚石单晶的表面侧发出的光致发光来获取光致发光图像信息,并获得光致发光图像信息。并且,在光致发光图像获取步骤中由照相机设备获取的光致发光图像信息从照相机设备侧传送到数据处理设备侧,并且可以确定金刚石单晶缺陷,从而执行数据处理。数据处理步骤,其中该设备将光致发光图像信息转换成至少一个可以在预定颜色空间上显示的色点;由于包含,因此可以以高可靠性分析金刚石单晶的缺陷分布。

著录项

  • 公开/公告号KR20200079668A

    专利类型

  • 公开/公告日2020-07-06

    原文格式PDF

  • 申请/专利权人 한국세라믹기술원;

    申请/专利号KR20180169043

  • 发明设计人 배시영;정성민;최형석;이명현;

    申请日2018-12-26

  • 分类号G01N21/33;G01N21/17;G01N33/38;

  • 国家 KR

  • 入库时间 2022-08-21 11:06:34

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