首页> 外国专利> A method for manufacturing a semiconductor wafer having an epitaxial layer in a deposition chamber, an apparatus for manufacturing a semiconductor wafer having an epitaxial layer, and a semiconductor wafer having an epitaxial layer

A method for manufacturing a semiconductor wafer having an epitaxial layer in a deposition chamber, an apparatus for manufacturing a semiconductor wafer having an epitaxial layer, and a semiconductor wafer having an epitaxial layer

机译:用于在沉积室中制造具有外延层的半导体晶片的方法,用于制造具有外延层的半导体晶片的设备以及具有外延层的半导体晶片

摘要

The present invention is directed to placing a substrate wafer in an edge region of the back surface of the substrate wafer on a placement region of the susceptor; Loading the substrate wafer on the susceptor and the susceptor into the deposition chamber by contacting the susceptor and transporting the substrate wafer on the susceptor and susceptor from the load lock chamber into the deposition chamber; Depositing an epitaxial layer on a substrate wafer; By unloading the deposition chamber by contacting the susceptor and transporting the semiconductor wafer with the susceptor and epitaxial layer from the deposition chamber into the load lock chamber, the semiconductor wafer is fabricated and deposited on the susceptor during deposition of the epitaxial layer. And unloading the deposition chamber and transporting the semiconductor wafer into the loadlock chamber.
机译:本发明的目的在于在基座的放置区域上的衬底晶片的背面的边缘区域中放置衬底晶片。通过接触基座并将基座和基座上的基板晶片装载到沉积室中,并将基座和基座上的基板晶片从加载锁定室传送到沉积室中;在衬底晶片上沉积外延层;通过使基座接触而使沉积室卸载,并将具有基座和外延层的半导体晶片从沉积室输送到负载锁定室,从而在外延层的沉积期间制造半导体晶片并将其沉积在基座上。并且卸载沉积室并将半导体晶片运送到加载互锁室中。

著录项

  • 公开/公告号KR102073498B1

    专利类型

  • 公开/公告日2020-02-04

    原文格式PDF

  • 申请/专利权人 실트로닉 아게;

    申请/专利号KR20187017044

  • 申请日2016-11-24

  • 分类号H01L21/02;C30B25/12;H01L21/324;H01L21/66;H01L21/683;H01L21/687;

  • 国家 KR

  • 入库时间 2022-08-21 11:05:23

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号