STTMRAM METHOD AND SYSTEM FOR SCREENING DEFECTIVE MAGNETIC TUNNEL JUNCTION OF SPINTRANSFER TORQUE MAGNETIC RANDOM ACCESS MEMORY

摘要

FIELD OF THE INVENTION The present invention relates to a method and system for screening defective cells in an STTMRAM, wherein the Incremental Stepping Pulse Stress includes different pulse conditions and lead times in each of the safe area, the screen area and the nominal breakdown area in the STTMRAM. By screening the defective MTJ element by applying the method, the defective MTJ element can be efficiently screened by improving screen accuracy while reducing screen time consumption.