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OXIDE FILM REMOVING METHOD OXIDE FILM REMOVING APPARATUS CONTACT FORMING METHOD AND CONTACT FORMING SYSTEM

机译:氧化膜去除方法氧化膜去除设备接触成形方法和接触成形系统

摘要

[Task] CD loss is suppressed when the silicon-containing oxide film formed on the silicon portion of the bottom of the pattern is removed. [Solutions] In a substrate to be processed having an insulating film having a predetermined pattern formed thereon and having a silicon-containing oxide film formed on a silicon portion at the bottom of the pattern, a method of removing an oxide film to remove the silicon-containing oxide film is performed on silicon formed at the bottom of the pattern. The step of removing the containing oxide film by ionic anisotropic plasma etching by plasma of a carbon-based gas, the step of removing the remainder of the silicon-containing oxide film after anisotropic plasma etching by chemical etching, and the residue remaining after chemical etching It has a process of removing.
机译:[任务]当去除形成在图案的底部的硅部分上的含硅氧化物膜时,CD损失被抑制。 [解决方案]在具有在其上形成有预定图案的绝缘膜并且在图案的底部的硅部分上形成有含硅的氧化膜的待处理基板中,一种去除氧化膜以去除硅的方法在形成于图案底部的硅上进行含氧化物膜。通过碳基气体的等离子体通过离子各向异性等离子体蚀刻去除包含的氧化膜的步骤,通过化学蚀刻去除各向异性等离子体蚀刻之后的剩余的含硅氧化膜的步骤以及在化学蚀刻之后残留的残留物的步骤它具有删除过程。

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