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OXIDE FOR SEMICONDUCTOR LAYER OF THIN-FILM TRANSISTOR SPUTTERING TARGET AND THIN-FILM TRANSISTOR

机译:薄膜晶体管溅射靶和薄膜晶体管的半导体层用氧化物

摘要

The oxide for the semiconductor layer of the thin film transistor according to the invention, including Zn, SSN and in, is composed of metal element content (atomic%) contained in the oxide, [Z], [Sn] and [cause], respectively, meeting 1 to 3 of the following mathematical expressions.[mathematical formula 1][mathematical formula 2][math 3]According to the invention, high mobility can be realized, and the pressure tolerance (the critical value voltage shift amount before and after the pressure permission is less) can also provide excellent thin film transistor oxides.
机译:根据本发明的用于薄膜晶体管的半导体层的氧化物,包括Zn,SSN和In,由氧化物,[Z],[Sn]和[原因]中包含的金属元素含量(原子%)组成,分别满足以下数学表达式的1至3。[数学公式1][数学公式2][数学3]根据本发明,可以实现高迁移率,并且耐压性(压力允许前后的临界值电压偏移量较小)也可以提供优异的薄膜晶体管氧化物。

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