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Testing circuit for the switching characteristics of semiconductor device
Testing circuit for the switching characteristics of semiconductor device
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机译:半导体器件开关特性测试电路
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摘要
As a test circuit for generating a double pulse for measuring the switching characteristics of a semiconductor device, To provide pulses driving protection IGBT pulse generator and DUT switching pulse generator Pulse Start circuit; A protection IGBT pulse generator that generates a pulse for driving the protection IGBT; And a DUT switching pulse generator for driving the device under test.
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