Testing of semiconductor devices using a testing device to which a number of circuits to be tested are connected via a program controlled switching matrix so that testing rates can be increased

摘要

Device for independent testing of a number of voltage supplied semiconductor devices comprises a programmable test device (2) with a voltage source (3) the output (4) of which connects to a switching matrix (5) that links the voltage supply to the semiconductor device being tested. The switching matrix comprises at least two switching devices (6) that are controlled by the programmable test device so individual semiconductor devices can be independently connected to a voltage source.