FPGA-based NAND memory chip testing device

摘要

The utility model relates to the field of testing integrated circuits of NAND-memory and is a testing device based on FPGA, with the possibility of mounting on the backplane of a modular testing system, which has the ability to connect to the control unit. The testing device is a separate board with a control microcontroller, FPGA, programmable voltage converters, detachable BGA-sockets and digital indicators. The testing device allows you to simultaneously and independently test many NAND memory chips during data read, write and erase operations, including in conditions of high and low operating temperatures. The testing device can be used as part of a modular testing system consisting of a backplane and several testing devices. The modular testing system can be connected to a control unit consisting of a workstation, an interface converter and power supplies. A feature of the utility model is the ability to operate testing devices both as part of a modular system under the control of a control unit, and in stand-alone mode without external control with the output of test results to digital indicators. 5 ill.