Modular system for electrical and functional testing of FPGA-based NAND memory chips

摘要

The utility model relates to the field of computing technology for testing integrated circuits for NAND memory. The technical result consists in providing the possibility of performing electrical testing of NAND memory microcircuits. The technical result is achieved through a modular system for electrical and functional testing of NAND-memory chips based on FPGAs, consisting of a testing unit containing a backplane and testing devices with detachable BGA-sockets for NAND-memory chips, designed to support the ONFI standard, where each the testing device is a single board on which a control microcontroller is installed, an algorithmic generator of test patterns based on an FPGA, digital indicators for displaying test results, while each testing device has a multiplexer capable of switching digital and analog signals and a parametric meter made with the ability to detect open and short circuits on the input and output pins of the NAND memory chip. 7 ill.