An electron imaging device 100, which is set up for electron transfer along an electron-optical axis OA from a sample 1 emitting electrons 2 to an energy analyzer device 200, comprises a first lens group 10 on the sample side, a second lens group 30 on the analyzer side and a deflection device 20, which is used to deflect the Electrons 2 is set up in an exit plane of the electron imaging device 100 in a deflection direction perpendicular to the electron-optical axis OA, the first lens group 10 having a first reciprocal plane RP1 within the first lens group 10 and a first Gaussian plane GP1 between the first and the second lens group 10, 30 and is set up to generate a first momentum distribution image of a momentum distribution of electrons 2 from sample 1 in the first reciprocal plane RP1 and to generate a first Gaussian image of sample 1 in the first Gaussian plane GP1, the second lens group 30 forms a second reciprocal plane RP2 on the analyzer side of the second lens group 30 and is set up to generate a second momentum distribution image of the momentum distribution of the electrons 2 from the sample 1 in the second reciprocal plane RP2, and the first lens group 10 to generate the first Gaussian image such a small size that the second pulse distribution image generated with the second lens group 30 is a parallel image. An electron spectrometer apparatus, an electron transfer method, and an electron spectrometry method are also described.
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