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Photodetector comprising polysilicon layer having enhanced responsivity and preparation method thereof

机译:包括具有增强的响应度的多晶硅层的光电探测器及其制备方法

摘要

The present invention relates to a photodetector including a polysilicon layer having improved sensitivity through high concentration doping on a polysilicon layer and a method for manufacturing the same. According to the present invention, the high concentration impurity doped in the polycrystalline silicon layer serves to lower the potential barrier formed in the energy band by saturating a number of trap states of grain boundaries that degrade electrical properties, so that the polycrystalline silicon layer doped with high concentration impurities Since the photocurrent generated by the excitation photodetector is hardly affected by the trap of the grain boundary, the sensitivity and external quantum efficiency are improved, and since it is easily deposited, it is possible to manufacture a high-performance photodetector at low cost.
机译:光电探测器及其制造方法技术领域本发明涉及一种光电探测器及其制造方法,该光电探测器包括通过在多晶硅层上进行高浓度掺杂而具有提高的灵敏度的多晶硅层。根据本发明,掺杂在多晶硅层中的高浓度杂质通过使一定数量的降低电性能的晶界的俘获态饱和,从而降低了在能带中形成的势垒,从而掺杂了多晶硅层。高浓度杂质由于激发光检测器产生的光电流几乎不受晶界陷阱的影响,因此灵敏度和外部量子效率得到改善,并且由于易于沉积,因此可以以较低的成本制造高性能的光检测器。成本。

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