首页> 外文期刊>Journal of Materials Chemistry, C. materials for optical and electronic devices >Enhanced responsivity of a graphene/Si-based heterostructure broadband photodetector by introducing a WS2 interfacial layer
【24h】

Enhanced responsivity of a graphene/Si-based heterostructure broadband photodetector by introducing a WS2 interfacial layer

机译:通过引入WS2界面层来增强石墨烯/ Si基异质结构宽带光电探测器的响应性

获取原文
获取原文并翻译 | 示例
           

摘要

Photodetectors based on two-dimensional/three-dimensional (2D/3D) semiconducting heterostructures have attracted tremendous attention in recent years due to their novel performance. Here, we found that the photodetection performance of the graphene (Gr)/Si 2D/3D heterostructure can be very broadly enhanced by introducing an optimized ultrathin WS2 film prepared by sulfidation as an interfacial layer. The fabricated Gr/WS2(10.9 nm)/Si photodetector shows a wide spectralresponse from 400 to 1800 nm with a maximum photoresponsivity of 8.96 x 10(4) A W-1 and photodetectivity of 8.86 x 10(11) Jones at 690 nm, which are more than three orders of magnitude higher than that of the Gr/Si photodetector. Such a high photoresponsivity can be attributed to the strong photogain induced by the hole trap states that exist in the WS2 film. With the increase in the WS2 film thickness, the photoresponsivity increases firstly owing to the increase of hole trap states, and then decreases due to the decrease in light transmittance through WS2. The device also shows a high responsivity of 0.735 A W-1 at 1550 nm by forming type-II interlayer excitation. Our results indicate that 2D transition metal dichalcogenides (TMDCs) could be a good candidate functioning as an interfacial layer for high performance Gr/Si photodetectors, which provide a facile way for enhancing the photodetection performance of van der Waals 2D/3D heterostructure photodetectors.
机译:基于二维/三维(2D/3D)半导体异质结构的光电探测器由于其新颖的性能,近年来引起了广泛关注。在这里,我们发现通过引入通过硫化制备的优化超薄WS2薄膜作为界面层,石墨烯(Gr)/Si 2D/3D异质结构的光探测性能可以得到非常广泛的增强。所制备的Gr/WS2(10.9 nm)/Si光电探测器显示出从400到1800 nm的宽光谱响应,最大光响应率为8.96 x 10(4)a W-1,在690 nm处的光探测效率为8.86 x 10(11)Jones,比Gr/Si光电探测器高出三个数量级以上。如此高的光响应率可归因于WS2薄膜中存在的空穴陷阱态诱导的强光增益。随着WS2薄膜厚度的增加,光响应率先是由于空穴陷阱态的增加而增加,然后由于WS2透光率的降低而降低。通过形成II型层间激发,该器件在1550nm处也显示出0.735AW-1的高响应度。我们的结果表明,2D过渡金属二卤化物(TMDC)可以作为高性能Gr/Si光电探测器的界面层,这为提高范德华2D/3D异质结构光电探测器的光电探测性能提供了一种简便的方法。

著录项

  • 来源
  • 作者单位

    Univ Elect Sci &

    Technol China State Key Lab Elect Thin Films &

    Integrated Devic Chengdu Sichuan Peoples R China;

    Univ Elect Sci &

    Technol China State Key Lab Elect Thin Films &

    Integrated Devic Chengdu Sichuan Peoples R China;

    Univ Elect Sci &

    Technol China State Key Lab Elect Thin Films &

    Integrated Devic Chengdu Sichuan Peoples R China;

    Univ Elect Sci &

    Technol China State Key Lab Elect Thin Films &

    Integrated Devic Chengdu Sichuan Peoples R China;

    Univ Elect Sci &

    Technol China State Key Lab Elect Thin Films &

    Integrated Devic Chengdu Sichuan Peoples R China;

    Univ Elect Sci &

    Technol China State Key Lab Elect Thin Films &

    Integrated Devic Chengdu Sichuan Peoples R China;

    Univ Elect Sci &

    Technol China State Key Lab Elect Thin Films &

    Integrated Devic Chengdu Sichuan Peoples R China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 物理化学(理论化学)、化学物理学;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号