首页> 外国专利> VERFAHREN ZUR CHARAKTERISIERUNG DER DURCHSCHNITTLICHEN VERNETZUNGSRATE EINER IN EINEM PHOTOVOLTAISCHEN MODUL VORGESEHENEN ENCAPSULATION-SCHICHT

VERFAHREN ZUR CHARAKTERISIERUNG DER DURCHSCHNITTLICHEN VERNETZUNGSRATE EINER IN EINEM PHOTOVOLTAISCHEN MODUL VORGESEHENEN ENCAPSULATION-SCHICHT

摘要

Method for characterizing the average crosslinking rate of an encapsulation layer (20), present in a photovoltaic module, comprising the following successive steps: a) providing a photovoltaic module comprising: -a first plate (10), - a plurality of photovoltaic cells (30), electrically connected to each other, - an encapsulation layer (20), encapsulating the plurality of photovoltaic cells (30), - a second plate (40), the encapsulation layer (20) and the plurality of photovoltaic cells (30) being located between the first and second plates (10, 40), b) covering the first plate (10) with an electrically conductive element (100), c) measuring the electrical resistance of the layer of encapsulation (20) between the plurality of photovoltaic cells (30) and the electrically conductive element (100), d) comparing the electrical resistance measured with predefined reference values, so as to determine the average rate of crosslinking of the coating e of encapsulation (20).

著录项

  • 公开/公告号EP3672067A1

    专利类型

  • 公开/公告日2020.06.24

    原文格式PDF

  • 申请/专利权人

    申请/专利号EP19217035.5

  • 发明设计人

    申请日2019.12.17

  • 分类号

  • 国家 EP

  • 入库时间 2022-08-21 10:53:10

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