Comparison of the FFT/matrix inversion and system matrix techniques for higher-order probe correction in spherical near-field antenna measurements

摘要

Two higher-order probe-correction techniques for spherical near-field antenna measurements are compared in details for the accuracy they provide and their computational cost. The investigated techniques are the FFT/matrix inversion and the system matrix inversion. Each of these techniques allows correction of general high-order probes, including non-symmetric dual-polarized antennas with independent ports. The investigation was carried out by processing with each technique the same measurement data for a challenging case with an antenna under test significantly offset from the center of rotation and a higher-order probe.