Theory and Practice of the FFT/Matrix Inversion Technique for Probe-Corrected Spherical Near-Field Antenna Measurements With High-Order Probes

摘要

A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made. The procedure is validated through measurements.