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Shape measurement of diffuse objects using short-range scanning of laser diode wavelength in speckle interferometry

机译:在散斑干涉测量中使用激光二极管波长的短程扫描来测量漫射物体的形状

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摘要

A phase φ of specklegram is a function both of an optical path difference L and wavelength λ . From this function, the optical path difference L, which is directly used to calculate a shape of an object, can be given as a function of d φ/d λ. In the proposed technique, a widely used laser diode is adopted as a wavelength-changeable light source, and its wavelength λ is scanned slowly within 0.25 nm by using current injection control of the diode. From specklegrams captured during wavelength scanning, changing amounts of φ are extracted on individual pixels with a modified phase shifting technique. Since a scanning range is very short, it is difficult to measure a changing amount of λ along each specklegram capturing. Then a reference height step is also inserted in a vision of CCD camera and changing amounts of φ are measured both on the reference step and the object. From the ratio of the total changing amounts of φ, the shape of the object is calculated. Experiments are carried out to confirm the validity of the method.
机译:斑点图的相位φ是光程差L和波长λ的函数。通过该函数,可以将直接用于计算物体的形状的光程差L作为dφ/ dλ的函数给出。在提出的技术中,采用广泛使用的激光二极管作为波长可变光源,并且通过使用二极管的电流注入控制在0.25nm内缓慢扫描其波长λ。利用改进的相移技术,从在波长扫描过程中捕获的散斑图中提取出变化量的φ。由于扫描范围非常短,因此很难测量每次散点图捕获过程中的λ变化量。然后,还将一个参考高度台阶插入CCD摄像机的视野中,并同时测量参考台阶和物体的φ变化量。根据总变化量的比率,计算物体的形状。进行实验以证实该方法的有效性。

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