首页> 外文OA文献 >Methods for Trustworthy Design of On-Chip Bus Interconnect for General-Purpose Processors
【2h】

Methods for Trustworthy Design of On-Chip Bus Interconnect for General-Purpose Processors

机译:通用处理器的片上总线互连的可靠设计方法

摘要

Military electronics rely on commodity processors, many of which are manufactured overseas where the trustworthiness of the foundries is uncertain. This thesis attempts to answer the question of whether common bus protocols in use today differ significantly with respect to security, by conducting an analysis of common integrated circuit bus protocols (Inter-Integrated Circuit [I2C], Advanced Microcontroller Bus Architecture [AMBA], HyperTransport, Wishbone, and CoreConnect) based on the Flaw Hypothesis Methodology (FHM). This thesis follows the four stages of FHM. The first stage is Flaw Generation, which involves creating hypothetical attack scenarios. The next is Flaw Confirmation, which involves confirming the flaws generated in the first stage through analysis of the specifications of the bus architectures as well as testing and research in the literature. The third stage is Flaw Generalization, which evaluates the impact of each flaw to determine whether it suggests that a more serious flaw exists in that bus architecture. The final stage is Flaw Elimination, which identifies strategies (and their costs) for mitigating the vulnerabilities based on techniques in the hardware security literature. We conclude that the bus architectures we analyzed differ significantly with respect to security.
机译:军用电子产品依赖于商品处理器,其中许多是在铸造厂的信誉不确定的海外制造的。本文试图通过分析常见的集成电路总线协议(内部集成电路[I2C],高级微控制器总线体系结构[AMBA],HyperTransport)来回答当今使用的通用总线协议在安全性方面是否存在显着差异的问题。 ,Wishbone和CoreConnect)基于缺陷假说方法(FHM)。本文遵循FHM的四个阶段。第一阶段是“缺陷生成”,其中涉及创建假设的攻击场景。下一个是缺陷确认,它涉及通过分析总线体系结构的规范以及文献中的测试和研究来确认在第一阶段中产生的缺陷。第三阶段是“缺陷泛化”,它评估每个缺陷的影响,以确定是否表明该总线体系结构中存在更严重的缺陷。最后一个阶段是“缺陷消除”,它根据硬件安全性文献中的技术确定缓解漏洞的策略(及其成本)。我们得出的结论是,我们分析的总线体系结构在安全性方面存在显着差异。

著录项

  • 作者

    Elson Jay F.;

  • 作者单位
  • 年度 2012
  • 总页数
  • 原文格式 PDF
  • 正文语种
  • 中图分类

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号