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High quality factor manganese-doped aluminum lumped-element kinetic inductance detectors sensitive to frequencies below 100 GHz

机译:对频率低于100 GHz敏感的高质量因子掺杂锰的铝集总元素动感检测器

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摘要

Aluminum lumped-element kinetic inductance detectors (LEKIDs) sensitive to millimeter-wave photons haveudbeen shown to exhibit high quality factors, making them highly sensitive and multiplexable. The superconductingudgap of aluminum limits aluminum LEKIDs to photon frequencies above 100 GHz. Manganese-dopedudaluminum (Al-Mn) has a tunable critical temperature and could therefore be an attractive material forudLEKIDs sensitive to frequencies below 100 GHz if the internal quality factor remains sufficiently high whenudmanganese is added to the film. To investigate, we measured some of the key properties of Al-Mn LEKIDs.udA prototype eight-element LEKID array was fabricated using a 40 nm thick film of Al-Mn deposited on aud500 µm thick high-resistivity, float-zone silicon substrate. The manganese content was 900 ppm, the measuredudTc = 694 ± 1mK, and the resonance frequencies were near 150 MHz. Using measurements of the forwardudscattering parameter S21 at various bath temperatures between 65 and 250 mK, we determined that theudAl-Mn LEKIDs we fabricated have internal quality factors greater than 2 × 105ud, which is high enough forudmillimeter-wave astrophysical observations. In the dark conditions under which these devices were measured,udthe fractional frequency noise spectrum shows a shallow slope that depends on bath temperature and probeudtone amplitude, which could be two-level system noise. The anticipated white photon noise should dominateudthis level of low-frequency noise when the detectors are illuminated with millimeter-waves in future measurements.udThe LEKIDs responded to light pulses from a 1550 nm light-emitting diode, and we used these lightudpulses to determine that the quasiparticle lifetime is 60 µs.
机译:已经证明,对毫米波光子敏感的铝集总元件动电感检测器(LEKID)具有高品质因数,使其具有高灵敏度和可复用性。铝的超导 udgap将铝LEKID限制为100 GHz以上的光子频率。掺杂锰的铝(Al-Mn)具有可调节的临界温度,因此,如果在薄膜中添加了 udman时内部品质因数仍然足够高,则对于对100 GHz以下频率敏感的 udLEKID来说,它可能是有吸引力的材料。为了调查,我们测量了Al-Mn LEKID的一些关键特性。 ud使用沉积在a ud500 µm厚的高电阻浮区上的40 nm厚的Al-Mn膜制造了原型八元素LEKID阵列。硅基板。锰含量为900 ppm,测得的udTc = 694±1mK,共振频率接近150 MHz。通过在65至250 mK之间的各种浴温下测量前向散射参数S21,我们确定 udAl-Mn LEKIDs的内部品质因子大于2×105 ud,对于 udmmimeter-波天体观测。在测量这些设备的黑暗条件下,分数频率噪声频谱显示出一个浅斜率,该斜率取决于水浴温度和探头 udtone幅度,这可能是两级系统噪声。将来的测量中,当检测器被毫米波照射时,预期的白色光子噪声应占主导地位。 udLEKID对来自1550 nm发光二极管的光脉冲作出响应,我们使用了这些光用脉冲确定准粒子寿命为60 µs。

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