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Design optimization on conductor placement in the slot of permanent magnet machines to restrict turn-turn short-circuit fault current

机译:永磁电机插槽中导体放置的设计优化,以限制匝间短路故障电流

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摘要

In Permanent Magnet (PM) machines, a turn-turn Short-Circuit (SC) fault is the most critical fault to eradicate. The fault introduces high SC current in the shorted turn which may consequently lead to secondary faults unless the fault is appropriately controlled. This paper proposes feasible conductors’ placement in a slot of PM machine to minimize such turn-turn fault current. In order to minimize the fault current, the conductor arrangement in a slot is optimized using multi-objective Genetic Algorithm (GA) incorporating with both analytical and Finite Element (FE) numerical tool. The possible combinations of conductors’ placement are set as variables and optimized for a given machine which is designed for safety critical applications. It is shown that the fault current associated to a single turn fault can be significant for the random winding placement even though the remedial strategies are put in place. It is also shown that the fault current can be limited significantly by rearranging the winding placement in a way to share slot-leakage fluxes. This is confirmed via experiment on E-core. Influences of the winding arrangement on both frequency dependent resistances and windings capacitances are experimented. It is demonstrated that adopting the winding arrangement that shares the slot-leakage flux effectively benefits to minimize the AC losses in addition to improved fault tolerance. But it increases the turn-turn capacitances whose effect however can be neglected as the resonance frequency occurs beyond the operational frequency range of the machines of interest
机译:在永磁(PM)机器中,转弯短路(SC)故障是最关键的故障。故障会在短路匝中引入较高的SC电流,否则可能会导致二次故障,除非对故障进行了适当的控制。本文提出了将可行的导体放置在永磁电机的插槽中,以最大程度地减小这种匝间故障电流。为了最小化故障电流,使用结合了分析和有限元(FE)数值工具的多目标遗传算法(GA)对插槽中的导体布置进行了优化。导体放置的可能组合被设置为变量,并针对特定于安全关键应用的给定机器进行了优化。结果表明,即使采取了适当的补救措施,与单匝故障相关的故障电流对于随机绕组布置也可能是重要的。还表明,通过以共享缝隙漏磁通的方式重新布置绕组位置,可以大大限制故障电流。这已通过E-core上的实验得到证实。实验了绕组布置对频率相关电阻和绕组电容的影响。事实证明,采用具有共同的缝隙漏磁通量的绕组结构,除了提高了容错能力外,还可以有效地减少交流损耗。但是它增加了匝间电容,但是当谐振频率超出目标机器的工作频率范围时,其影响可以忽略不计

著录项

  • 作者

    Arumugam Puvaneswaran;

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  • 年度 2016
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  • 原文格式 PDF
  • 正文语种 en
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