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Influence of Second Reflow on the Intermetallic Compound Growth with Different Surface Finish

机译:二次回流对不同表面光洁度的金属间化合物生长的影响

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摘要

The formation and growth of the intermetallic were frequently discussed since lead-free solder took place replacing the lead solder. However, the effect of multiple reflow process on the intermetallic morphology that was subjected to aging still needs further investigation. Thus, this study aimed to investigate the effect of the second reflow towards the intermetallic compound formation and growth. Two types of surface finishes were used such as Immersion Tin (ImSn) and Electroless Nickel Immersion Gold (ENIG). Both test boards were reflowed once with Sn-3.0Ag-0.5Cu at the temperature of 225 °C and soaking for 8 seconds. Then, they were reflowed again at the same temperature for 25 minutes prior to an isothermal aging process for 250, 500, 1000 and 2000 hours at the temperature of 150 °C. The ProgRes C3 IM7200 Optical Microscope and ImageJ were used for the microstructural study, which includes morphology and thickness. Results indicated that IMC thickness formed between solder and ImSn surface finish increased significantly with 1.28 μm incremental when exposed to the second reflow whereas the IMC thickness of ENIG surface finish was increased for up to 0.15 μm. In addition, ENIG showed higher activation energy as compared to ImSn. © 2016 Trans Tech Publications, Switzerland.
机译:由于无铅焊料代替了铅焊料,因此经常讨论金属间化合物的形成和生长。然而,多次回焊工艺对经历时效的金属间形态的影响仍需进一步研究。因此,本研究旨在研究第二次回流对金属间化合物形成和生长的影响。使用了两种类型的表面光洁度,例如浸锡(ImSn)和化学镍浸金(ENIG)。将两个测试板在225°C的温度下用Sn-3.0Ag-0.5Cu回流一次,并浸泡8秒钟。然后,将它们在相同温度下再次回流25分钟,然后在150°C的温度下进行250、500、1000和2000小时的等温老化过程。 ProgRes C3 IM7200光学显微镜和ImageJ用于微观结构研究,包括形态和厚度。结果表明,当暴露于第二次回流焊时,焊料和ImSn表面粗糙度之间形成的IMC厚度以1.28μm的增量显着增加,而ENIG表面粗糙度的IMC厚度增加直至0.15μm。另外,与ImSn相比,ENIG显示出更高的活化能。 ©2016瑞士Trans Tech Publications。

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