首页> 外文OA文献 >Fabrication and Characterization of Double- and Single-Clamped CuO Nanowire Based Nanoelectromechanical Switches
【2h】

Fabrication and Characterization of Double- and Single-Clamped CuO Nanowire Based Nanoelectromechanical Switches

机译:双夹紧CuO纳米线基纳米机电开关的制造与表征

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Electrostatically actuated nanoelectromechanical (NEM) switches hold promise for operation with sharply defined ON/OFF states, high ON/OFF current ratio, low OFF state power consumption, and a compact design. The present challenge for the development of nanoelectromechanical system (NEMS) technology is fabrication of single nanowire based NEM switches. In this work, we demonstrate the first application of CuO nanowires as NEM switch active elements. We develop bottom-up and top-down approaches for NEM switch fabrication, such as CuO nanowire synthesis, lithography, etching, dielectrophoretic alignment of nanowires on electrodes, and nanomanipulations for building devices that are suitable for scalable production. Theoretical modelling finds the device geometry that is necessary for volatile switching. The modelling results are validated by constructing gateless double-clamped and single-clamped devices on-chip that show robust and repeatable switching. The proposed design and fabrication route enable the scalable integration of bottom-up synthesized nanowires in NEMS.
机译:耐静电纳米机电(NEM)开关保持承诺,用于急定地定义的开/关,高开/关电流比,低关闭状态功耗以及紧凑的设计。纳米机电系统(NEMS)技术开发的本挑战是制造单纳米线基NEM开关。在这项工作中,我们证明了CuO纳米线作为NEM开关有源元件的第一次应用。我们开发了NEM开关制造的自下而上和自上而下的方法,例如CuO纳米线合成,光刻,蚀刻,电极纳米线的介电流对准,以及适用于可伸缩生产的构建装置的纳米操纵。理论建模找到了易失性切换所需的设备几何形状。通过构造芯片上的无意型双夹紧和单夹式设备,可验证建模结果,其显示稳健和可重复的切换。所提出的设计和制造路由使得能够在NEM中的自下而上合成纳米线的可扩展集成。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号