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Detection of IR and sub/THz radiation using MCT thin layer structures: design of the chip, optical elements and antenna pattern

机译:使用MCT薄层结构检测IR和Sub / THz辐射:芯片,光学元件和天线方向图的设计

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摘要

Two-color un-cooled narrow-gap MCT (mercury-cadmium-telluride) semiconductor thin layers, grown by liquid phase epitaxy or molecular beam epitaxy methods on high resistivity CdZnTe or GaAs substrates, with bow-type antennas were considered both as sub-terahertz direct detection bolometers and 3...10-micrometer infrared photoconductors. Optical system with aspheric THz lenses were designed and manufactured. An antenna pattern of structures on the thick substrate was discussed, and sensitivity of detector in both IR and sub-THz regions was measured.
机译:通过液相外延或分子束外延方法在高电阻率CdZnTe或GaAs衬底上采用弓形天线生长的两色非冷却窄间隙MCT(汞-镉-碲化物)半导体薄层被认为是亚色的。太赫兹直接检测测辐射热计和3 ... 10微米红外光电导体。设计并制造了具有非球面太赫兹透镜的光学系统。讨论了厚基板上结构的天线方向图,并测量了红外和亚太赫兹区域的探测器灵敏度。

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