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Embedded Analog Physical Unclonable Function System to Extract Reliable and Unique Security Keys

机译:嵌入式模拟物理不可渗透功能系统,以提取可靠和独特的安全键

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摘要

Internet of Things (IoT) enabled devices have become more and more pervasive in our everyday lives. Examples include wearables transmitting and processing personal data and smart labels interacting with customers. Due to the sensitive data involved, these devices need to be protected against attackers. In this context, hardware-based security primitives such as Physical Unclonable Functions (PUFs) provide a powerful solution to secure interconnected devices. The main benefit of PUFs, in combination with traditional cryptographic methods, is that security keys are derived from the random intrinsic variations of the underlying core circuit. In this work, we present a holistic analog-based PUF evaluation platform, enabling direct access to a scalable design that can be customized to fit the application requirements in terms of the number of required keys and bit width. The proposed platform covers the full software and hardware implementations and allows for tracing the PUF response generation from the digital level back to the internal analog voltages that are directly involved in the response generation procedure. Our analysis is based on 30 fabricated PUF cores that we evaluated in terms of PUF security metrics and bit errors for various temperatures and biases. With an average reliability of 99.20% and a uniqueness of 48.84%, the proposed system shows values close to ideal.
机译:物联网(IOT)功能的设备已经成为我们日常生活中越来越普遍。例子包括可穿戴设备传输和处理的个人数据和智能标签与客户互动。由于涉及敏感数据,这些设备需要对攻击者进行保护。在这种情况下,基于硬件的安全原语例如物理不可克隆功能(PUF的)提供了有力的解决方案,以确保互连的设备。的PUF的主要好处,在与传统的加密方法组合,是安全密钥是从下层芯电路的随机变化固有衍生。在这项工作中,我们提出了一个全面的基于模拟技术的PUF评估平台,使一个可扩展的设计,可以进行定制,以适应所需的密钥和位宽的数量方面应用需求的直接访问。所提出的平台涵盖完整的软件和硬件实现,并允许从所述数字电平返回到直接参与响应生成过程中的内部模拟电压跟踪PUF响应产生。我们的分析是基于30个捏造PUF核心,我们在不同的温度和偏见PUF安全指标和比特错误进行评价。用的99.20%的平均可靠性和48.84%的独特性,所提出的系统示出了值接近理想。

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