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CMOS Power Device Modeling and Amplifier Circuits

机译:CmOs功率器件建模和放大器电路

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摘要

A power amplifier (PA) is a key part of the RF front-end in transmitters for a local broadband network. Today, commercial PAs are made of III-V HEMT and HBT technology with excellent results. An integrated system-on-chip power amplifier circuit using CMOS technology for cost-effective and spectrum-efficient high-speed wireless communication presents major challenges because power amplifiers have been the limiting components in RF CMOS transmitter integrated circuits (ICs). At high frequencies, the distributed effect and power device-scaling issues put other constraints on PA design such as the trade-off between output power (Pout) and power added efficiency (PAE).Recently, CMOS has become attractive for low-cost and high-level integration due to the advancement of NMOS performance with ft and fmax > 100 GHz and is available from commercial CMOS foundries. However, the foundry-provided BSIM-RF model is unable to accurately predict the I-V characteristics and RF behaviors (ft and fmax) of power devices with widths of several hundred microns. Therefore, an advanced large-signal model which is able to predict distributed nonlinear effects is crucial for the successful design of high-frequency PAs. The microwave lumped and distributed layout parasitic effect in the 130 nm (BSIM3v3-RF) and 90 nm (BSIM4-RF) models to accurately predict gain, output power, and harmonic distortions of power MOSFETs at millimeter wave frequencies.The proposed power device model is verified for single devices as well as for the integrated power amplifier circuits in S-band and W-band applications. For S-band WiMAX application, we have developed an accurate modeling with layout parasitic of power CMOS devices and designed lossless matching networks to achieve single-end PA performance of 31 dB gain, 21.4 dBm output power, and 14.5% PAE at the 1 dB compression point. The measured maximum output power is 25.5 dBm and the associated PAE is 32%. For W-band application, a compact two-stage CMOS power amplifier is designed with gain boosting at the common gate transistor, source degeneration for the cascode devices and LC short stub matching networks. The amplifier was fabricated and demonstrated with excellent RF performance of 18 dB gain, 10.8 dBm linear output power, 13.3 dBm saturated power, and 11.8% PAE at 80 GHz with a minimum chip area of 0.35 mm2 in 90 nm CMOS technology. Monolithic power-combining techniques are attractive for delivering linear power over 20 dBm at W-band range due to the size reduction of the combiner. A W-band monolithic CPW Wilkinson power combiner of two CMOS power amplifiers is implemented in 90 nm CMOS technology. The 77 to 83 GHz CMOS PA achieved the 17 dB small-signal gain, 4.5 GHz 3 dB bandwidth, 10.6 dBm linear output power, 12.3 dBm saturated power, and 3.9% PAE at 80 GHz.
机译:功率放大器(PA)是本地宽带网络发射器中RF前端的关键部分。如今,商用功率放大器采用III-V HEMT和HBT技术制成,具有出色的效果。由于功率放大器一直是RF CMOS发射器集成电路(IC)的限制组件,因此采用CMOS技术进行成本有效且频谱有效的高速无线通信的集成片上系统功率放大器电路提出了重大挑战。在高频率下,分布效应和功率器件缩放问题对功率放大器设计带来了其他限制,例如输出功率(Pout)和功率附加效率(PAE)之间的权衡。最近,CMOS在低成本和低功耗方面变得越来越有吸引力。 ft和fmax> 100 GHz时,由于NMOS性能的提高而实现了高级集成,可从商业CMOS代工厂获得。但是,代工厂提供的BSIM-RF模型无法准确预测宽度为几百微米的功率器件的I-V特性和RF行为(ft和fmax)。因此,能够预测分布式非线性效应的高级大信号模型对于成功设计高频功率放大器至关重要。微波在130 nm(BSIM3v3-RF)和90 nm(BSIM4-RF)模型中集总并分布了寄生效应,以准确预测功率MOSFET在毫米波频率下的增益,输出功率和谐波失真。已针对S波段和W波段应用中的单个器件以及集成功率放大器电路进行了验证。对于S波段WiMAX应用,我们已经开发了具有功率CMOS器件寄生特性的精确建模,并设计了无损匹配网络,以实现单端PA性能:31 dB增益,21.4 dBm输出功率和1dB时的14.5%PAE。压缩点。测得的最大输出功率为25.5 dBm,相关的PAE为32%。对于W波段应用,设计了一种紧凑的两级CMOS功率放大器,该放大器在公共栅极晶体管上具有增益提升功能,为共源共栅器件提供源极退化,并具有LC短截线匹配网络。该放大器的制造和演示具有出色的RF性能:在80 GHz频率下具有18 dB增益,10.8 dBm线性输出功率,13.3 dBm饱和功率和11.8%PAE,在90 nm CMOS技术中最小芯片面积为0.35 mm2。由于组合器的尺寸减小,单片功率组合技术对于在W波段范围内提供超过20 dBm的线性功率具有吸引力。两个CMOS功率放大器的W波段单片CPW Wilkinson功率合成器采用90 nm CMOS技术实现。 77至83 GHz的CMOS PA在80 GHz时可实现17 dB的小信号增益,4.5 GHz的3 dB带宽,10.6 dBm的线性输出功率,12.3 dBm的饱和功率以及3.9%的PAE。

著录项

  • 作者

    Chan Doris A.;

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  • 年度 2010
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  • 原文格式 PDF
  • 正文语种 {"code":"en","name":"English","id":9}
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