Scanning Electron Microscopy/X-ray Fluorescence Characterization of Post-Abatement Dust

摘要

Scanning electron microscopy (SEM) and laboratory X-ray fluorescence (XRF) wereused to characterize post-abatement dust collected with a HEPA filtered vacuum. Three size fractions of resuspended dust (0-30 micrometers, 2.5-15 micrometers, and <2.5 micrometers were collected on teflon filters and analyzed by energy-dispersiveXRF. Automated SEM was used to determine the size, morphology, and chemistry ofindividual particles from 0.2 micrometers to greater than 250 micrometers. Minerals associated with constructionmaterials, paint fillers, and soil were the dominant species in all size fractions. Lead-rich particles were found in all sizes and could be grouped into three categories: lead-only (including lead oxide and lead carbonate), mixed lead/minerals, and automotive lead. Isolated lead oxide or lead carbonate particles derived from paint pigments were the dominant form of the lead-bearing particles in the size fraction <15 micrometers.