Testing Multi-Port Memories. Theory and Practice.

摘要

Contents: Abstract; Acknowledgements; Introductory; Introduction; Semiconductor Memory Architecture; Space of Memory Faults; Preparation for Circuit Simulation; Testing Two-Port SRAMs; Tests for Two-Port SRAMs; Testing Restricted Two-Port SRAMs; Testing p-Port SRAMs; Tests for p-Port SRAMs; Testing Restricted p-Port SRAMs; Conclusions; Simulations Results for Two-Port SRAMs; Simulation Results for Three-Port SRAMs.