Two Double Crystal X-Ray Diffraction Systems for Sorting Quartz Oscillator Blanks by Angle

摘要

Two double diffraction X-ray system for the precision sorting of quarts resonator blanks according to angle are described together with full drawings and assembly and installation instruction. One system is designed specifically for the measurement of AT cuts. The other is more flexible, having provisions for the adjustment of the reference crystal. This second machine also be employ a rotary, three-point, vacuum chuck, which could also be used with the fixed reference crystal, instead of the fixed, three-point, vacuum shuck. The use of one or the other of these chucks is important, especially for the accurate measurement of thin blanks. Both systems are designed for installation on a General Electric XRD-4 X-ray. Instructions for installing the fixed system on a General Electric XRD-2 are also given.