首页> 美国政府科技报告 >SECONDARY STANDARDS LABORATORY MEASUREMENT SYSTEM OPERATION PROCEDURE HA-01 MICROWAVE ATTENUATION, X-BAND (8.2 TO 12.4 KMCPS) 0 TO 50 DB PREPARED PRINCIPALLY
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SECONDARY STANDARDS LABORATORY MEASUREMENT SYSTEM OPERATION PROCEDURE HA-01 MICROWAVE ATTENUATION, X-BAND (8.2 TO 12.4 KMCPS) 0 TO 50 DB PREPARED PRINCIPALLY

机译:二级标准实验室测量系统操作程序Ha-01微波衰减,X-BaND(8.2至12.4 KmCps)0至50 DB原则上准备

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摘要

This procedure describes the operation of a secondary standards laboratory calibration system which is used to calibrate X-band microwave attenuators of waveguide size 1/2" X 1" (outside dimensions).nThe instrument under calibration will be referred to herein as the Test Instrument.nAll data must be recorded on the Calibration Report form.nThe system instrumentation accuracy is given in Section 3.

著录项

  • 作者

  • 作者单位
  • 年度 1959
  • 页码 1-23
  • 总页数 23
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工业技术;
  • 关键词

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