首页> 美国政府科技报告 >Preliminary Assessment of the Philips PW 1270Multi-Channel X-Ray Spectrometer for the Analysis of Oxide Materials,
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Preliminary Assessment of the Philips PW 1270Multi-Channel X-Ray Spectrometer for the Analysis of Oxide Materials,

机译:用于分析氧化物材料的飞利浦pW 1270多通道X射线光谱仪的初步评估,

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摘要

The performance of the Philips PW 1270for the analysis of Fe (sub T),MnO, V2O5, TiO2,CaO, P2O5, SiO2, Al2O3and MgO in oxide materials at different flux:sample ratios has been assessed. It has been established that,using a chromium target X-ray tube,good sensitivities are achieved on the lighter elements,and that short-term reproducibilities are equivalent to those predicted from counting statistics. All relevant data are given in detail. The use of the computer and software supplied by the manufacturer greatly enhances the flexibility of the instrument. The use of a regression program to calculate alpha-factors is discussed in detail,and some reservations about its use are expressed.

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