The Measurement of Residual Stresses of General Orientation by X-Ray Diffraction Techniques

摘要

To determine stresses from lattice spacings d sub phi psi measured by X-ray diffraction in dependence of the directions defined by (phi psi), the sq sin psi technique is used, assuming linearity between d sub phi psi and sq sin psi. However, deviations are determined from linearity through experimentation. Nonlinear d sub phi psi via sq sin psi dependencies attributed to very characteristic texture and stresses are discussed. Arc shaped stresses with psi or 0 deviatons from the linear were determined expermentally with polished specimens. Experimental analysis of deformed running surfaces of antifriction elements resulted in the same dependencies. The reason for this nonlinearity is a residual stress system lying outside the specimen system (the system measured). Conditions and means by which arc shaped strain distributions can be evaluated are described.