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Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction
Measuring and analyzing residual stresses and their gradients in materials using high resolution grazing incidence X-ray diffraction
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机译:使用高分辨率掠入射X射线衍射测量和分析材料中的残余应力及其梯度
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摘要
A high resolution grazing incidence X-ray diffraction technique for measuring residual stresses and their gradients as a function of depth in thin film materials on substrates or in bulk materials is disclosed. The technique includes positioning a material relative to an X-ray source and an X-ray detector, performing an Omega scan to determine an Omega offset, setting the incidence angle at a first target incidence angle based on the Omega offset and greater than the critical angle of the material, performing a grazing incidence X-ray diffraction scan, analyzing the results to identify diffraction peaks, selecting a diffraction peak, setting the incidence angle at a second target incidence angle based on the Omega offset and a desired penetration depth, performing two theta scanning on a range of two theta values around the selected diffraction peak, performing refraction correction, and determining residual stress values for the material.
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