Measurement of Residual Stresses by X-Ray Diffraction Techniques.

摘要

The idea of measuring residual stresses by x-ray diffraction was first proposed by Lester and Aborn (1925). In this report the main aim is to present, in a single chapter, many of the recent instrumental advances and to explain the fundamental limitations associated with this measurement. Many current applications are described in those areas where the measurement has already proven to be useful.