20 Ghz Proof-of-Concept Test Model Results for a Multiple Scan Beam Dual Reflector Antenna

摘要

A full scale 20 GHz antenna model was designed, fabricated and tested. The model is intended to test the low sidelobe beam scanning capability of a new class of an offset dual reflector and feed array configuration. The offset main reflector and subreflector surfaces are custom shaped by a computer synthesis procedure. The derived optics result in beam scan loss under 1 db over the + or - 12.3 beamwidths by + or - 5.8 beamwidths scan volume while maintaining low sidelobes. It is found that the measured and computed patterns are in good agreement.