Electromagnetic Fields Backscattered from an S-Shaped Inlet Cavity with an Absorber Coating on Its Inner Walls

摘要

The EM backscatter from a two-dimensional S-shaped inlet cavity is analyzed using three different techniques, namely a hybrid combination of asymptotic high frequency and modal methods, an integral equation method, and the geometrical optics ray method, respectively. This inlet has a thin absorber coating on its perfectly conducting inner walls and the planar interior termination is made perfectly conducting. The effect of the absorber on the inner wall is treated via a perturbation scheme in the hybrid approach where it is assumed that the loss is sufficiently small for the method to be valid. The results are compared with the backscatter from a straight inlet cavity to evaluate the effect of offsetting the termination in the S-bend configuration such that it is not visible from the open end of the inlet. The envelope of the backscatter pattern for the straight inlet is always seen to peak around the forward axis due to the large return from the directly visible termination, and the pattern envelope tapers off away from the forward axis. Offsetting the termination causes the envelope of the backscatter pattern to flatten out, thereby reducing the return near the forward axis by several dB. The absorber coating reduces the pattern level of the straight inlet in directions away from the forward axis but has little effect on the peak near the axis; furthermore, the absorber coating is seen to consistently reduce the backscatter from the S-bend inlet for almost all incidence angles. The hybrid method gives excellent agreement with experimental data and with the integral equation solution, whereas, the geometrical optics ray tracing method is able to generally predict the average of the bachscatter pattern but not the pattern details.