Automated measurement of the bit-error rate as a function of signal-to-noise ratio for microwave communications systems

摘要

The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal to noise ratio (or E sub b/E sub o). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.