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Determination of Impurities in Silicon Carbide by ICP AES (Inductively Coupled Plasma Atomic Emission Spectrometry) after Coprecipitation with Lanthanum Hydroxide

机译:氢氧化镧共沉淀ICp-aEs(电感耦合等离子体原子发射光谱法)测定碳化硅中的杂质

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摘要

Sample decomposition and a method to separate impurities from a matrix are examined to identify the impurities in silicon carbide powder by ICP AES. This method made it possible to determine fifteen elements such as aluminum, iron, which are among the major impurities found in silicon carbide.

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