Analytical and photogrammetric characterization of a planar tetrahedral truss

摘要

Future space science missions are likely to require near-optical quality reflectors which are supported by a stiff truss structure. This support truss should conform closely with its intended shape to minimize its contribution to the overall surface error of the reflector. The current investigation was conducted to evaluate the planar surface accuracy of a regular tetrahedral truss structure by comparing the results of predicted and measured node locations. The truss is a 2-ring hexagonal structure composed of 102 equal-length truss members. Each truss member is nominally 2 meters in length between node centers and is comprised of a graphite/epoxy tube with aluminum nodes and joints. The axial stiffness and the length variation of the truss components were determined experimentally and incorporated into a static finite element analysis of the truss. From this analysis, the root mean square (RMS) surface error of the truss was predicted to be 0.11 mm (0004 in). Photogrammetry tests were performed on the assembled truss to measure the normal displacements of the upper surface nodes and to determine if the truss would maintain its intended shape when subjected to repeated assembly. Considering the variation in the truss component lengths, the measures rms error of 0.14 mm (0.006 in) in the assembled truss is relatively small. The test results also indicate that a repeatable truss surface is achievable. Several potential sources of error were identified and discussed.