FY11 End of Year Report - NEPP SOC Devices.

摘要

This is the final report for fiscal year (FY) 2011 NEPP System-on-a-Chip (SOC) Devices task. This task seeks to provide improved methods for SOC testing to the NASA community, with the goal of providing data that is of interest to NASA and that meets the standards of the wider radiation-effects community. This report describes continued efforts to establish qualification and radiation testing methods appropriate to SOC devices. This NEPP task seeks to understand the impact of radiation effects on devices of interest to NASA programs. Because SOC devices are combinations of several types of computer circuit elements, many types of test approaches are applicable for the various elements of the devices. The current work is part of a multi-year effort to establish test methods based on examination of existing methods, development of new methods, and in-the-field verification of methods by radiation-testing SOCs of interest. The present report for FY11 discusses the efforts carried out under this NEPP task. This year, an examination of SOCs with NASA applicability was conducted, augmented by consideration of device types with minimal previous coverage as well as those that can expand the scope of the previous efforts. These were combined to provide the widest coverage of device types of interest to NASA, but were not so broad of scope as to limit the effectiveness of any test development or radiation-test validation of test methods. This task is expected to continue, gathering information about test methods appropriate for NASA missions and developing test data appropriate for devices of interest. The longer term goal of the task is to develop a guideline describing a qualification approach and radiation testing methods. The methods discussed in this report, relating to multicore, RHBD, and multiple functional blocks on an SOC are expected to be developed further in the FY2012 follow-up effort under this task.