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Using High Temperature Electrical Resistivity Measurements to Determine the Quality of Diamond Films

机译：用高温电阻率测量法测定金刚石薄膜的质量

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Vandersande, Jan W.; Zoltan, L. D.;
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年度 1994
页码 1-1
总页数 1
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
DIAMOND FILMS; ELECTRICAL RESISTIVITY; HIGH TEMPERATURE; TEMPERATURE MEASUREMENT; diamond films;

机译：钻石薄膜;电阻率;高温;温度测量;钻石薄膜;

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8. Electrical Resistivity of Natural Diamond and Diamond Films Between Room Temperature and 1200 C: Status Update [R] . Vandersande, Jan W., Zoltan, L. D. 1993

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Using High Temperature Electrical Resistivity Measurements to Determine the Quality of Diamond Films

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