Application of FEM to Estimate Complex Permittivity of Dielectric Material atMicrowave Frequency Using Waveguide Measurements

摘要

A simple waveguide measurement technique is presented to determine the complexdielectric constant of a dielectric material. The dielectric sample is loaded in a shorted x-band rectangular waveguide. Using a network analyzer; the reflection coefficient of the shorted waveguide (loaded with sample) is measured. Using the Finite Element Method (FEM), the exact reflection coefficient of the shorted waveguide (loaded with sample) is determined as a function of the dielectric constant. Matching the measured value of the reflection coefficient with the reflection coefficient calculated using the FEM utilizing the Newton-Raphson Method, an estimate of the dielectric constant of a dielectric material is obtained. A comparison of estimated values of dielectric constant obtained from simple waveguide modal theory and the present approach is presented.