Local Built-in Potential on Grain Boundary of Cu(In,Ga)Se2 Thin Films

摘要

We report on a direct measurement of two-dimensional potential distribution on the surface of Cu(In,Ga)Se2 (CIGS) thin films using a nanoscale electrical characterization of scanning Kelvin probe microscopy (SKPM). The potential measurement reveals a higher surface potential or a smaller work function on grain boundaries (GBs) of the film than on the grain surfaces. This demonstrates the existence of a local built-in potential on GBs and that the GB is positively charged. The role of the built-in potential in device performance was further examined by tuning Ga content or band gap of the film. With increasing Ga content, the GB potential drops sharply in a Ga range of 28%-38%. Comparing the change in the built-in potential to the theoretical and experimental photoconversion efficiencies, we conclude that the potential plays a significant role in the device conversion efficiency of NREL's three-stage CIGS device.