首页> 美国政府科技报告 >Investigation of Applications of Compton Backscatter
【24h】

Investigation of Applications of Compton Backscatter

机译:康普顿背散射应用研究

获取原文

摘要

An analytical study of detector yield as a function of source-collimator-detector geometry has been conducted to support the conclusions reached and the recommendations made in this study.nThe equipment necessary to evaluate the principle of radiation thickness gaging by use of Compton backscatter has been assembled and tested. Spectral response of three collimator-detector geometries has been measured for radiation from cesium-137 and tin-113 sources.nUsing the source-collimator-detector assembly yielding the highest signal-to-background ratio, inspection scans of simulated pipewall defects have been made to evaluate maximum defect sensitivity of the probe.

著录项

  • 作者

  • 作者单位
  • 年度 1960
  • 页码 1-46
  • 总页数 46
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工业技术;
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号