This paper presents an experimental study of the electrical conduction mechanisms in thick film resistors. The resistors were made from one custom and three commercially formulated inks with resistivity compositions ranging from 10 2to 106 Ω/□ in decade increments. Their microstructure and composition have been examined using optical and scanning electron microscopy, electron microprobe analysis, x-ray diffraction, and various chemical analyses. This portion of our study shows that the resistors are heterogeneous mixtures of metal oxide particles (~ 4× 10-5 cm diameter) and a lead silicate glass. The metal oxide particles are ruthenium containing pyrochlores, and are joined to form a continuous three dimensional network of chain segments.
展开▼
