Design, Assembly, and Testing of X-Ray Diffraction Stress Analyzer for Stainless Steel Pipes

摘要

An x-ray diffraction stress analyzer for the measurement of the longitudinal component of the residual stress in proximity of welds inside stainless steel pipes 10 in in dia and larger has been assembled. The design of the stress analyzer is based on the use of Chromium radiation from a commercial diffraction tube and on the application of the single exposure technique. The heart of the system is a scintillator based position sensitive detector. The diffracted x-rays are converted to light and transmitted to an image intensifier through flexible fiber optic bundles. After intensification, the light distribution generated by the diffracted x-ray beams is measured by photosensitive diode arrays. The signal from the arrays is digitized and analyzed by a minicomputer. The instrument has been completely assembled and preliminary stress measurements have been performed.