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Propagation of Errors in Quantitative AEM Microanalysis Using XEDS and EELS

机译：利用XEDs和EELs进行定量aEm微量分析误差的传播

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A general expression has been derived relating the relative error in a composition measurement to relative errors in the respective input parameters needed for quantitative XEDS and EELS microanalysis. (ERA citation 08:032112)

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作者
Zaluzec, N. J.;
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年度 1981
页码 1-8
总页数 8
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Electron Microscopy; Thin Films; Microanalysis; Errors; Chemical Analysis; Equations;

机译：电子显微镜;薄膜;微量分析;误差;化学分析;方程式;
入库时间 2022-08-29 11:32:48

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专利

1. Light elements quantitative x-ray microanalysis of thin samples in STEM. Absorption correction using EELS data [J] . Banchet V., Michel J., Jallof E., Journal of Physics, D. Applied Physics: A Europhysics Journal . 2003,第13期

机译：STEM中薄样品的轻元素定量X射线显微分析。使用EELS数据进行吸收校正
2. A comparison between quantitative EELS and APFIM microanalysis of carbonitride grains in cermets [J] . J. Zackrisson, W. Grogger, F. Hofer, Ultramicroscopy . 1999,第1a4期

机译：金属陶瓷中碳氮化物晶粒的定量EELS和APFIM显微分析的比较
3. Application of the parametric bootstrap method to determine statistical errors in quantitative X-ray microanalysis of thin films [J] . Armigliato A, Balboni R, Rosa R Journal of Microscopy . 2007,第Pta1期

机译：参数自举法在薄膜定量X射线微分析中确定统计误差的应用
4. On the Performance of XEDS and EELS in the AEM: 25 Years Later [C] . H.L. Fraser, D.O. Klenov, Y.C. Wang, International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting . 2011

机译：25年后的XEDS和EELS在AEM中的表现
5. Characterization of Boron/Iron-Oxide Core/Shell Structure for Boron Neutron Capture Therapy by STEM/EELS-XEDS and M?ssbauer Spectroscopy [D] . Hayward, Mason. 2019

机译：硼中子捕获治疗的硼/氧化铁芯/壳结构的表征茎/鳗鱼和MβSSBAUER光谱法
6. Error Propagation Analysis for Quantitative Intracellular Metabolomics [O] . Jana Tillack, Nicole Paczia, Katharina Nöh, 2012

机译：定量细胞内代谢组学的误差传播分析
7. Quantitative Microanalysis with high Spatial Resolution: Application of FEG-DTEM XEDS Microanalysis to the Characterization of Complex Microstructures in Irradiated Low Alloy Steet [O] . Williams, D.B., Watanabe, M. and Burke, M.G. 2001

机译：高空间分辨率的定量微量分析：FEG-DTEm XEDs微量分析在辐照低合金钢板复杂微观结构表征中的应用
8. AEM-Based XEDS/EELS Microanalysis: A Materials Science Perspective [R] . Zaluzec, N. J. 1986

机译：基于aEm的XEDs / EELs微量分析：材料科学视角

Propagation of Errors in Quantitative AEM Microanalysis Using XEDS and EELS

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