Ion Beam Analysis Methods for Determining Major and Minor Element Concentrations in Artifacts

摘要

Two quantitative analytical techniques, Rutherford Backscattering Spectrometry (RBS) and Proton Induced X-ray Emission (PIXE), based on MeV ion beams from a Van de Graaff accelerator have been used in an archaeometric determination of major and minor element concentrations in flint artefacts with two forms of patination and a metal fragment found during excavation of a viking settlement. (Atomindex citation 16:049797)