Rapid Annealing of Temperature-Compensated, Precision Voltage References Following Fast-Neutron Irradiation

摘要

Substantial, short-term voltage variations have been observed during the rapid annealing of twin-junction, temperature-compensated, precision voltage references (TC PVRs) immediately following exposure to fast-neutron bursts of up to 4 x 10 exp 14 n/cm exp 2 . The short term recovery has been found to be dominated by minority carrier lifetime reduction in the forward biased junction of this composite junction device. The shape of the annealing curve has been obtained and found to be roughly independent of neutron fluence in the range from 1 to 4 x 10 exp 14 n/cm exp 2 . (ERA citation 10:028628)