Sandia's Fault Analysis System for Non-DFT Designs

摘要

A toolset is described that is used to do comprehensive fault analysis on Sandia's past, present, and future generation designs. This toolset provides very fast realistic fault simulation at both the gate and switch level, hierarchical fault reporting, and automatic annotation of undetectable faults. The toolset is built around the Mentor Graphics design system and a Mach1000 hardware accelerator from Silicon Solutions. This session describes the work at Sandia National Laboratories' Center for Radiation Hardened Microelectronics (the CRM) in Albuquerque, New Mexico. The CRM designs and manufactures radiation hardened microelectronics for hostile environments. CRM parts are used in satellites, deep space probes, and weapon systems - hence the reliability of these parts must be exceedingly high. Since the yield of a radiation hardened process is inherently low, Sandia must insure high test vector coverage of all detectable faults. (ERA citation 13:001509)